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Behaviour of implanted arsenic during rapid thermal annealing of Ti on Si

Identifieur interne : 000321 ( France/Analysis ); précédent : 000320; suivant : 000322

Behaviour of implanted arsenic during rapid thermal annealing of Ti on Si

Auteurs : J. P. Ponpon [France] ; A. Saulnier [France] ; R. Stuck [France]

Source :

RBID : ISTEX:F7FDD327DFCAD271DBBF0762D95E4D4BD71CB4DC

Abstract

Abstract: The reaction during rapid thermal annealing of the Ti-Si couple with arsenic implanted either into titanium or into silicon has been investigated from the point of view of suicide formation kinetics and impurity redistribution. In contrast with similar experiments on other refractory metals, tungsten for example, the reaction is not blocked by the presence of arsenic but a temperature and dose dependent impurity effect leading to a lowering of the growth rate of the disilicide phase is observed. This has been attributed to arsenic segregation in the grain boundaries of the growing suicide which reduces the transport of silicon via easy diffusion paths towards the unreacted metal or a metal rich suicide phase. Arsenic, when present in the metal, has been found to produce the same effects as oxygen at the early beginning of the annealing. However, after the reaction has started the respective behaviour and influence of arsenic and oxygen become completely different.

Url:
DOI: 10.1007/BF00616694


Affiliations:


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ISTEX:F7FDD327DFCAD271DBBF0762D95E4D4BD71CB4DC

Le document en format XML

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<div type="abstract" xml:lang="en">Abstract: The reaction during rapid thermal annealing of the Ti-Si couple with arsenic implanted either into titanium or into silicon has been investigated from the point of view of suicide formation kinetics and impurity redistribution. In contrast with similar experiments on other refractory metals, tungsten for example, the reaction is not blocked by the presence of arsenic but a temperature and dose dependent impurity effect leading to a lowering of the growth rate of the disilicide phase is observed. This has been attributed to arsenic segregation in the grain boundaries of the growing suicide which reduces the transport of silicon via easy diffusion paths towards the unreacted metal or a metal rich suicide phase. Arsenic, when present in the metal, has been found to produce the same effects as oxygen at the early beginning of the annealing. However, after the reaction has started the respective behaviour and influence of arsenic and oxygen become completely different.</div>
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